XRF2010 - 20th Anniversary Symposium:
Practical XRF Application in Industry
June 11, 2010

 

8:30 – 8:40 A.M.

Welcome & Flash Back
Charlie Wu, University of Western Ontario

8:40 – 9:20 A.M.

A Well Cemented Technique - XRF
Maggi Loubser, PPC Cement

9:20 – 10:00 A.M.

Olduvai Gorge, Tanzania: XRF & XRD studies of the Geological Contents of early Man and early Mars
Lindsay McHenry, University of Wisconsin-Milwaukee

10:00 – 10:30 A.M.

XRF Spectrometry Applications on the Analysis of Titanium based SRC Catalysts
Adela dela Rosa, Cormetech Inc.

10:30 – 10:45 A.M.

Coffee/Tea Break (outside B&G-1084)

10:45 – 11:15 A.M.

Petroleum and Beyond – XRF Analysis of Alternative Energy Source
Valerie Omatsu-Baas, Natural Resources Canada

11:15 – 11:45 A.M

New Advances and Applications using X-ray Fluorescence Analyzer for Metals Testing in the Scrap Recycling Industry
Jim Stachowiak, ThermoFisher Scientific

11:45 A.M. –
12:25 P.M.

The Application of XRF to Gold Refining and Coin Manufacturing at Royal Canadian Mint
Mike Hinds, Royal Canadian Mint

12:25 – 1:25 P.M.

Lunch @ B&G 1084 & MSA bldg. lobby

1:25 – 1:55 P.M.

The Challenges and Benefits of XRF Spectrometry at Xstrata Zinc Brunswick Smelter
Denis Foulem, Xstrata Zinc Brunswick Smelter

1:55 – 2:25 P.M.

Chemical TXRF: Advantages for Pharmaceutical and Food Testing
Michael Rider, Bruker-axs

2:25 - 2:55 P.M.

Applications of XRF to trace analysis of Hydrocarbons
Matthew Kulzick, BP Amoco Chemical

2:55 – 3:25 P.M.

Screening for Restricted Elements using XRF
Alexander Seyfarth, Bruker-axs Inc.

3:25 – 3:45 P.M.

Coffee/Tea Break (outside B&G-1084)

3:45 – 4:00 P.M.

SRM2855 Additive Elements in Polyethylene: WDXRF Analysis and Certification Approach
John Sieber, National Institute of Standards and Technology (NIST)

Please contact Dr. John Sieber at NIST for his presentation

4:00 – 4:15 P.M.

Some Methods for Checking for Errors in background, MAC's and Sample Mix-up
James Willis, James Willis Consultants cc

4:15 – 5:00 P.M.

Slide Shows provided from previous course participants
Rick Conrey, Washington State University, XRF Lab
Pierre Ricou, Arkema Inc.
Joanna Lugowski, Ministry of Transportation Ontario
Naser Abdo & Bassam Khader, National XRF Lab - UAE
Joost Oostra - Customer training in Latin America
Xiang Yang, St. Mary's University

5:00 P.M.

Closing Remark